Microwave Imaging
Scanning microwave impedance microscopy (MIM) is capable of mapping out the dielectric information of materials by guiding microwave signals (~1GHz) to a micro-machined cantilever probe compatible with atomic-force microscopy (AFM) platforms. The spatial resolution is set by the tip size (~100nm) rather than the wavelength of the radiation. The microwave electronics can detect small capacitance change below 1aF.
Imaging at microwave frequencies is ideal to study local electrical information in complex materials and to reveal electronic inhomogeneity in multi-phase boundaries. We have so far obtained interesting images on semiconductor devices, nanoparticles, nanowires, and biological samples. Using the newly implemented cryogenic MIM setup equipped with a powerful 9T magnet, we expect to tackle many long-standing problems in condensed matter physics and material science.
